Comment by yread

From a comment on avherald:

"Had the same problem with low power CMOS 3 transistor memory cells used in implantable defibrillators in the 1990s. Needed software detection and correction upgrade for implanted devices, and radiation hardening for new devices. Issue was confirmed to be caused by solar radiation by flying devices between Sydney and Buenos Aires over the south pole multiple times, accumulating a statistically significant different error rate to control sample in Sydney."